Corporate

Nanofilm’s Participation in Aachen Polymer Optics Days 2022

Earlier this month, we took part in the Aachen Polymer Optics Days (APOD) 2022 that was held in Aachen, Germany from 1st to 2nd June. Organized by the Fraunhofer Institute for Production Technology (IPT), the Fraunhofer Institute for Laser Technology (ILT) and the Institute for Plastics Processing (IKV) in Industry and Craft at RWTH Aachen University, it was a conference for optical plastics manufacturing that garnered more than 20 participating organizations; and it provided a platform for sharing of knowledge and opportunities in fields including tool and mold making, new and conventional materials and optical systems.

Our CTO, Mr. Lars Lieberwirth, delivered a speech on “Coatings on Optics in Tooling and Components”. He spoke on our proprietary Filtered Cathodic Vacuum Arc (“FCVA”) technology and our Nanofabrication capabilities that allows us to produce precise polymer optics with superior coating properties. Some of the notable coatings for such applications are our trademarked TAC-ON® for mold & tool inserts for optics, and the environmentally friendly MiCC® for polymer optics, semiconductors, and electronics.

Another highlight of the APOD 2022 was our newly installed Glass Mold Coater that was exhibited during the Fraunhofer IPT Lab Tours. Featuring a lock-load chamber design, the system utilizes our FCVA technology to produce TAC-ON® coatings with high hardness, superior temperature resistance and extremely low friction coefficient. This allows applications like freeform lenses, glass lens molds and complex mold inserts to be produced more reliably and efficiently.

Nanofilm is based in Singapore, with operations in China, Japan, Vietnam, Germany and the USA. Our nanotechnology-based solutions are utilized in a wide range of industries such as computer, communications and consumer electronics (“3C”), automotive, precision engineering, printing and imaging, and new energy.

For more information, please contact enquiry@nti-nanofilm.com.

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